Effects of the Channel Length on the Nanoscale Field Effect Diode Performance

Authors

  • arash rezaei Department of Electrical & Computer Engineering, Babol Noshirvani University of Technology, Babol, Iran.
  • Bahram Azizollah-Ganji Department of Electrical & Computer Engineering, Babol Noshirvani University of Technology, Babol, Iran.
  • Morteza Gholipour Department of Electrical & Computer Engineering, Babol Noshirvani University of Technology, Babol, Iran.
Abstract:

Field Effect Diode (FED)s are interesting device in providing the higherON-state current and lower OFF–state current in comparison with SOI-MOSFETstructures with similar dimensions. The impact of channel length and band-to-bandtunneling (BTBT) on the OFF-state current of the side contacted FED (S-FED) has beeninvestigated in this paper. To find the lowest effective channel length, this device issimulated with 75, 55 and 35 nm channel length and the results obtained are presentedin this article. Our numerical results show that the ION/IOFF ratio can be varied from 104to 100 for S-FED as the channel lengths decrease. We demonstrate that for channellengths shorter than 35 nm by considering the Band-to-Band tunneling model, the SFEDdevice does not turn off.

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Journal title

volume 3  issue 1

pages  29- 40

publication date 2018-06-01

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